Methods for forming transition metal dichalcogenide films

TW202634099APending Publication Date: 2026-08-16TOKYO ELECTRON LTD +1
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Patent Information

Application Number
TW114140445
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-10-29
Filing Date
2025-10-20
Publication Date
2026-08-16

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Patent Text Reader

Abstract

This invention provides a technique for suppressing oxidation at the membrane interface when forming a transition metal dichalcogenide film. A method comprising forming a transition metal dichalcogenide film by sulfiding a transition metal-containing film, and comprising the following steps: (a) providing a substrate comprising at least one first film selected from the group consisting of silicon-containing films and metal-containing films; (b) forming a first transition metal-containing film on the first film in a nitrogen-containing gas atmosphere; and (c) after (b), annealing the substrate in a first atmosphere containing a sulfiding gas.
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