See-through metrology systems, apparatus, and methods for optical devices
TW202634229APending Publication Date: 2026-08-16APPLIED MATERIALS INC
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Patent Information
- Application Number
- TW115115638
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2021-10-04
- Filing Date
- 2021-10-14
- Publication Date
- 2026-08-16
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Abstract
Embodiments of the present disclosure relate to optical devices for augmented, virtual, and / or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of see-through metrics for optical devices.
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