Radiation Image Acquisition Device and Method
TW202634247APending Publication Date: 2026-08-16HAMAMATSU PHOTONICS KK
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Patent Information
- Application Number
- TW114145703
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-09
- Filing Date
- 2025-11-24
- Publication Date
- 2026-08-16
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Abstract
The X-ray image acquisition device 1 of the present invention includes: an X-ray source 2 having an electron gun 21 and a target 22; a control unit 3 that controls the incident position of the electron beam EB between a first incident position and a second incident position; an X-ray detection unit 4 that acquires an X-ray image of an object OJ; and a processing unit 5 that acquires shape data related to the shape of the object OJ based on a first image acquired as an X-ray image in a first state with the incident position at the first incident position and a second image acquired as an X-ray image in a second state with the incident position at the second incident position; and the control unit 3 controls the incident position of the electron beam EB between the first incident position and the second incident position based on the difference between a first magnification M1 and a second magnification M2, and moves at least a portion of the image of the object OJ across the boundary between pixels 41 between the first state and the second state.
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