Radiation Image Acquisition Device and Method

TW202634247APending Publication Date: 2026-08-16HAMAMATSU PHOTONICS KK
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Patent Information

Application Number
TW114145703
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-09
Filing Date
2025-11-24
Publication Date
2026-08-16

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Abstract

The X-ray image acquisition device 1 of the present invention includes: an X-ray source 2 having an electron gun 21 and a target 22; a control unit 3 that controls the incident position of the electron beam EB between a first incident position and a second incident position; an X-ray detection unit 4 that acquires an X-ray image of an object OJ; and a processing unit 5 that acquires shape data related to the shape of the object OJ based on a first image acquired as an X-ray image in a first state with the incident position at the first incident position and a second image acquired as an X-ray image in a second state with the incident position at the second incident position; and the control unit 3 controls the incident position of the electron beam EB between the first incident position and the second incident position based on the difference between a first magnification M1 and a second magnification M2, and moves at least a portion of the image of the object OJ across the boundary between pixels 41 between the first state and the second state.
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