Method and device for determining sample properties

TW202634257APending Publication Date: 2026-08-16NANOSURF
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Patent Information

Application Number
TW114144055
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-17
Filing Date
2025-11-12
Publication Date
2026-08-16

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    Figure TWG2TA001072974_003
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Abstract

The present invention relates to determining at least one property of a sample with a device that comprises a micromechanical sensor having an apex. A first quantity indicative of a response of the micromechanical sensor due to an apex-sample-interaction and a second quantity indicative of a response of the micromechanical sensor due to a local actuation force acting locally on or in the micromechanical sensor are obtained. At least one first calibration value for calibrating, e.g., correcting, the first quantity and at least one second calibration value for calibrating, e.g., correcting, the second quantity are provided. The at least one first calibration value is configured for causing a change to one or more determined positions of the apex in the response of the micromechanical sensor due to the apex-sample-interaction. The at least one second calibration value is configured for causing a change to one or more determined positions of the apex in the response of the micromechanical sensor due to the local actuation force acting locally on or in the micromechanical sensor. The at least one property of the sample is determined based on the obtained first quantity, the obtained second quantity, the provided at least one first calibration value and the provided at least one second calibration value.å
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