Probe card with elasticity and method of manufacturing the same

Abstract

Disclosed is a probe card with elasticity and method of manufacturing the same, the probe card with elasticity comprising a film layer and a plurality of elastic probes, each elastic probe having a first contact section, a second contact section and a needle body having an elastic component, the elastic probes being disposed on the film layer, at least a portion of the needle body being covered by the film layer and at least a portion of the elastic component being surrounded by the film layer. Therefore, it can be used for the interface between the testing machine and the device under test, and can improve the problems of easy deterioration of the conductive adhesive, short service life, and limited number of tests.

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