Electrical measurement devices, systems, and methods
TW202634272APending Publication Date: 2026-08-16寶紳電子集團公司
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- TW114142691
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-04
- Filing Date
- 2025-11-03
- Publication Date
- 2026-08-16
Smart Images

Figure TWG2TA001072900_001 
Figure TWG2TA001072900_002 
Figure TWG2TA001072900_003
Abstract
Electrical measurement devices, systems, and methods receive user input(s) selecting an electrical element from a list of electrical elements, each electrical element of the list of electrical elements having an impedance associated therewith. Impedance data of the electrical element’s impedance is accessed from a data storage location. Voltage drop across an in-circuit electrical path passing through the electrical element is measured in response to a first conductive probe element of an electrical measurement device being in contact with a first terminal of the electrical element and a second conductive probe element of the electrical measurement device being in contact with a second terminal of the electrical element. Amperage of the electrical element is determined by the processor of the electrical measurement device from the voltage drop and the impedance, and a signal is transmitted to one or more indicators for indicating a status of the electrical element.
Need to check novelty before this filing date? Find Prior Art