Electrical measurement devices, systems, and methods

TW202634272APending Publication Date: 2026-08-16寶紳電子集團公司
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Patent Information

Application Number
TW114142691
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-04
Filing Date
2025-11-03
Publication Date
2026-08-16

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Abstract

Electrical measurement devices, systems, and methods receive user input(s) selecting an electrical element from a list of electrical elements, each electrical element of the list of electrical elements having an impedance associated therewith. Impedance data of the electrical element’s impedance is accessed from a data storage location. Voltage drop across an in-circuit electrical path passing through the electrical element is measured in response to a first conductive probe element of an electrical measurement device being in contact with a first terminal of the electrical element and a second conductive probe element of the electrical measurement device being in contact with a second terminal of the electrical element. Amperage of the electrical element is determined by the processor of the electrical measurement device from the voltage drop and the impedance, and a signal is transmitted to one or more indicators for indicating a status of the electrical element.
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