Inspection apparatus, inspection method, capacitor manufacturing method, and inspection program

Abstract

[Problem] This disclosure provides an inspection apparatus, inspection method, capacitor manufacturing method, and inspection program that can eliminate the possibility of short-life chip capacitors that cannot be detected by conventional insulation resistance measurement. [Solution] The inspection apparatus includes: a current measuring unit for measuring the current during the charging period of the chip capacitor and the current during the insulation resistance measurement period after the charging period; a voltage measuring unit for measuring the voltage applied to the chip capacitor during the charging period and the insulation resistance measurement period; and a judgment unit for determining whether the chip capacitor is qualified or not based on whether either the current measured by the current measuring unit or the voltage measured by the voltage measuring unit during the charging period and the insulation resistance measurement period meets a predetermined threshold.

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