Apparatus for testing an electronic device

Abstract

An apparatus for testing an electronic device is provided. The apparatus includes: a test board; a test socket disposed on the test board, wherein the test socket includes a socket body and a plurality of contact pins extending vertically through the socket body; and a probe assembly including a socket clamp and test probes operably mounted on the socket clamp, wherein when the socket clamp is mounted on the test socket, the socket clamp fixes the test probes relative to the test socket and guides the test probes to contact a target contact pin among the plurality of contact pins.

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