Manufacturing methods for micro microscope systems, laser processing equipment, monitoring devices, and electronic components

TW202634325APending Publication Date: 2026-08-16OOKUMA ELECTRONICS
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Patent Information

Application Number
TW114150417
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-01-09
Filing Date
2025-12-22
Publication Date
2026-08-16

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Abstract

The purpose of this invention is to achieve near-scanning electron microscope resolution using an optical microscope. The micromicroscope system of this invention includes: an objective lens that collects light from a sample; and an image sensor that captures an image of the light collected by the objective lens; wherein the pixel size of the image sensor is in the range of 1 μm to 4 μm, and the resolution of the microlens of the image sensor is in the range of 1.20 times to 2.20 times that of the objective lens.
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