Information processing apparatus, inspection apparatus, information processing method, inspection method, and learning method

TW202634359APending Publication Date: 2026-08-16LASERTEC CORP
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Patent Information

Application Number
TW114146539
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-13
Filing Date
2025-11-28
Publication Date
2026-08-16

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    Figure TWG2TA001073098_003
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Abstract

A high-precision information processing apparatus, inspection apparatus, information processing method, inspection method, and learning method are provided. The information processing apparatus 200 of this embodiment includes: a learning unit 210 for model learning; a camera image acquisition unit 220 for acquiring camera images CI; a reference image generation unit 230 for generating reference images RI; and an evaluation unit 240 for evaluating an object 300 based on a comparison between the reference image RI and the camera image CI. The learning unit 210 includes: a structural representation data acquisition unit 211 for acquiring a plurality of structural representation data; a category differentiation unit 212 for classifying the plurality of structural representation data into any one of a plurality of categories; a representative position acquisition unit 213 for selecting representative data from structural representation data belonging to the same category and acquiring a representative position corresponding to that category; and a training unit 214 for training the model.
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