Semiconductor structure and methods of forming the same

TW202634991APending Publication Date: 2026-08-16TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information

Application Number
TW114136450
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-07-25
Filing Date
2025-09-23
Publication Date
2026-08-16

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Abstract

A method includes forming nanostructures over a semiconductor substrate; forming a front-side interconnect structure over a front-side of the nanostructures; directly bonding a first side of a carrier substrate to the front-side interconnect structure using a dielectric-to-dielectric bonding process; depositing a dielectric layer on a second side of the carrier substrate; and forming a back-side interconnect structure over a back-side of the nanostructures. In an embodiment, the dielectric layer provides a tensile stress.
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