Substrate processing system, apparatus, and method for determining the placement state of annular members

TW202635085APending Publication Date: 2026-08-16TOKYO ELECTRON LTD
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Patent Information

Application Number
TW114144059
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-20
Filing Date
2025-11-12
Publication Date
2026-08-16

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Abstract

This invention provides a technique for determining the setting state of an annular member in a substrate processing system. The substrate processing system includes a substrate processing chamber, a substrate support section, a transfer chamber, a transfer robot, and a control section; and the control section is configured to perform: moving at least one displacement sensor above the annular member in the substrate processing chamber by a transfer arm, measuring the height of a plurality of parts on the annular member by the at least one displacement sensor; and determining the setting state of the annular member based on the measured height of the plurality of parts.
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