Internal process estimation system and internal process estimation method

TW202635473APending Publication Date: 2026-09-01HITACHI LTD
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Patent Information

Application Number
TW115106634
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-02-25
Filing Date
2026-02-24
Publication Date
2026-09-01

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Abstract

This invention provides an internal process estimation system and method that estimate and visualize the sequence of unknown internal processes. One aspect of the invention is an internal process estimation system comprising a search unit, an actual measurement value input unit, and an output unit. The search unit applies multiple element models in multiple sequences to the multiple element regions of a virtual model that are continuously divided into multiple element regions in one direction to create multiple virtual models that simulate the state transition of an actual device from a first state to a second state. The actual measurement value input unit inputs actual measurement values ​​of the actual device in the second state. The search unit evaluates the virtual models based on the difference between predicted data output from the values ​​based on the first state input to the multiple virtual models and the actual measurement values. The output unit outputs the evaluation result of the search unit.
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