Manufacturing method of multi-layered structures
TW202635916APending Publication Date: 2026-09-01ULVAC INC
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Patent Information
- Application Number
- TW115104163
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-02-04
- Filing Date
- 2026-02-03
- Publication Date
- 2026-09-01
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Abstract
The method for manufacturing a multilayer structure of the present invention comprises: a first epitaxial film formation step, wherein a first layer oriented along the (100) surface is formed on the (100) surface of a silicon substrate by sputtering; a second epitaxial film formation step, wherein a second layer of Pt oriented along the (100) surface is formed on the first layer by sputtering; and a third epitaxial film formation step, wherein a third layer oriented along the (100) surface is formed on the second layer by sputtering.
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