Manufacturing method of multi-layered structures

TW202635916APending Publication Date: 2026-09-01ULVAC INC
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Patent Information

Application Number
TW115104163
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-02-04
Filing Date
2026-02-03
Publication Date
2026-09-01

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Abstract

The method for manufacturing a multilayer structure of the present invention comprises: a first epitaxial film formation step, wherein a first layer oriented along the (100) surface is formed on the (100) surface of a silicon substrate by sputtering; a second epitaxial film formation step, wherein a second layer of Pt oriented along the (100) surface is formed on the first layer by sputtering; and a third epitaxial film formation step, wherein a third layer oriented along the (100) surface is formed on the second layer by sputtering.
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