Radiation examination equipment and radiation examination methods

Abstract

The radiation inspection apparatus 1 of the present invention includes: a sensor unit 10, which includes a plurality of pixels 11 that generate signals corresponding to radiation R from a radiation generator 2; a sensor control unit 21 that drives the sensor unit 10 by time-delay integration; and a control device 5 that outputs position information Pii of an object OJ in the direction from the radiation generator 2 toward the sensor unit 10 based on the signals; and the sensor unit 10 includes: a first region 101, which is composed of a portion of pixels 11a and driven by the sensor control unit 21 at a first scan rate; and a second region 102, which is composed of another portion of pixels 11b and driven by the sensor control unit 21 at a second scan rate different from the first scan rate; the control device 5 outputs position information Pii based on the signals generated in each of the pixels 11a in the first region 101 and the pixels 11b in the second region 102.

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