Test table and handler for testing electronic components
TW202636124APending Publication Date: 2026-09-01TECHWING CO LTD
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Patent Information
- Application Number
- TW114143337
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-06
- Filing Date
- 2025-11-06
- Publication Date
- 2026-09-01
Smart Images
Figure 00000000_0000_ABST
Abstract
This invention relates to a test stage, test tray, and processor for testing electronic components. The test stage and test tray of this invention include at least one assembly area, in which a plurality of loading points are assembled, allowing at least two dissimilar electronic components to be loaded or unloaded. The processor of this invention utilizes the test stage or test tray of this invention. According to this invention, testing for achieving optimized wafer sets can be easily performed.
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