Method of forming a silicon on insulator substrate
TW202636853APending Publication Date: 2026-09-01SK HYNIX INC
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Patent Information
- Application Number
- TW114139779
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-26
- Filing Date
- 2025-10-15
- Publication Date
- 2026-09-01
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Abstract
A method of forming an SOI substrate including a hydrogen thermal treatment performed on a pretreated sacrificial wafer, under high temperature. A stopper layer and a semiconductor layer may be sequentially formed on a first surface of the sacrificial wafer on which the hydrogen (H2) thermal treatment was performed. The stopper layer and the semiconductor layer may be formed by an epitaxial growth process using a mixed precursor including a monosilane (MS) source and a dichlorosilane (DCS) source.
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