Real-time image processing to measure substrate offsets and apply corrections to robot end effector positioning

TW202636889APending Publication Date: 2026-09-01APPLIED MATERIALS INC
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Patent Information

Application Number
TW114139430
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-22
Filing Date
2025-10-14
Publication Date
2026-09-01

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Abstract

A system includes a substrate support configured to support and rotate a substrate a sensor positioned above the substrate support. Control logic causes the sensor to generate a images of an area of the substrate support and a portion of the substrate in a field of view of the sensor during rotation of the substrate support. Control logic performs edge detection by intensity-thresholding the images to identify a first edge of the substrate and a second edge of the substrate support. Control logic generates data representing a gap distance between the first and second edges and determines, from the data, a magnitude and a direction of an offset between a first center of the substrate support and a second center of the substrate. Control logic converts the offset to coordinates within a coordinate system of a robot and provides the coordinates to the robot.
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