Carbon-doped pvd deposited cobalt liner layer for improved cu reflow

TW202636958APending Publication Date: 2026-09-01APPLIED MATERIALS INC
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW114143848
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-11
Filing Date
2025-11-11
Publication Date
2026-09-01

Smart Images

  • Figure TWG2TA001074642_001
    Figure TWG2TA001074642_001
  • Figure TWG2TA001074642_002
    Figure TWG2TA001074642_002
  • Figure TWG2TA001074642_003
    Figure TWG2TA001074642_003
Patent Text Reader

Abstract

Interconnect structures in a microelectronic device and methods of forming the same are described. The method comprises processing a substrate comprising a dielectric layer disposed thereon, the dielectric layer having one or more features including an opening, a sidewall, a top surface, a bottom. The method includes forming a cobalt liner layer having a thickness in a range of from
Need to check novelty before this filing date? Find Prior Art