Carbon-doped pvd deposited cobalt liner layer for improved cu reflow
TW202636958APending Publication Date: 2026-09-01APPLIED MATERIALS INC
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Patent Information
- Application Number
- TW114143848
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-11
- Filing Date
- 2025-11-11
- Publication Date
- 2026-09-01
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Abstract
Interconnect structures in a microelectronic device and methods of forming the same are described. The method comprises processing a substrate comprising a dielectric layer disposed thereon, the dielectric layer having one or more features including an opening, a sidewall, a top surface, a bottom. The method includes forming a cobalt liner layer having a thickness in a range of from
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