Semiconductor structure and fabrication method thereof

TW202636979APending Publication Date: 2026-09-01UNITED MICROELECTRONICS CORP
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Patent Information

Application Number
TW114107012
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-02-26
Publication Date
2026-09-01

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Abstract

A semiconductor structure includes a substrate having at least one through substrate via (TSV) forming region thereon; a dielectric layer disposed on the substrate; and at least one through substrate via disposed in the TSV forming region and penetrating through the dielectric layer and into the substrate. The at least one through substrate via comprises a plurality of stress-relief slits elongating in a radial direction.
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