Polishing method and polishing apparatus

TW202637326APending Publication Date: 2026-09-16EBARA CORP
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Patent Information

Application Number
TW114145728
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-29
Filing Date
2025-11-24
Publication Date
2026-09-16

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Abstract

[Problem] To provide a technology that can stabilize the pressure control of the grinding head when the grinding rate changes significantly during the grinding of workpieces such as wafers. [Solution] The grinding method includes: during the grinding of workpiece W, calculating a plurality of grinding rates for a plurality of regions on the surface of workpiece W, detecting a plurality of change points of the plurality of grinding rates, and before detecting the plurality of change points of the plurality of grinding rates, the grinding head 1 performs a grinding amount control action to grind the plurality of regions of workpiece W with the same grinding amount, and after detecting the plurality of change points of the plurality of grinding rates, the grinding head 1 performs a contour control action to grind the contour of the plurality of regions of workpiece W, so that the film thickness contour of workpiece W reaches the target film thickness contour.
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