Chemical mechanical polishing slurry

TW202637788APending Publication Date: 2026-09-16ANJI MICROELECTRONICS TECH (SHANGHAI) CO LTD
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
TW114148368
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-25
Filing Date
2025-12-10
Publication Date
2026-09-16
Patent Text Reader

Abstract

The invention provides a chemical mechanical polishing slurry for semiconductor material manufacturing processes, comprising: nano α-alumina abrasive particles, a dispersant, a dispersing aid, an organic carboxylic acid, an oxidizing agent, water, and a pH adjuster. It is characterized by good dispersibility, strong stability, low particle size, and long-term stability. The invention employs the synergistic effect of an amphoteric surfactant and an anionic polymer to promote the dispersion of alumina abrasive particles in the polishing slurry through a steric hindrance stabilization mechanism, ensuring the long-term stability of the polishing slurry system without affecting tungsten polishing.
Need to check novelty before this filing date? Find Prior Art