Amorphpous silicon gapfill using icp plasma at low pressure and higher temperature

TW202637873APending Publication Date: 2026-09-16APPLIED MATERIALS INC
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Patent Information

Application Number
TW115100692
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-06-26
Filing Date
2026-01-08
Publication Date
2026-09-16

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Abstract

Methods and devices for forming gap fill materials on the surface of a substrate are provided herein. Embodiments include flowing a silicon-containing precursor into a process chamber at a flow rate that allows for maintaining a pressure inside the process chamber at less than
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