Self-calibration method and a microscope-based system for illumination uniformity

TW202638031APending Publication Date: 2026-09-16SYNCELL (TAIWAN) INC
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Patent Information

Application Number
TW114152212
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-31
Filing Date
2025-12-31
Publication Date
2026-09-16

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Abstract

A self-calibration method for illumination uniformity includes executing a scan of a fluorescent calibration slide with an illuminating light source over at least one field of view; obtaining an intensity image of the field of view; dividing the intensity image into a plurality of segments; analyzing an intensity of each one of the plurality of segments; calculating a plurality of calibrated laser powers for each one of the plurality of segments; and controlling an optical modulator based on the plurality of calibrated laser powers for each one of the plurality of segments.
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