Probe, electrical connection device, and method for manufacturing probe

TW202638056APending Publication Date: 2026-09-16NIHON MICRONICS KK
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Patent Information

Application Number
TW114141738
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-11-20
Filing Date
2025-10-28
Publication Date
2026-09-16

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Abstract

A probe of this present invention comprises: a distal portion having a distal end surface that faces toward an object to be inspected; an expandable portion, one end of which is connected to the distal portion; and a proximal portion connected to the other end of the expandable portion. The expandable portion includes a structure in which a plurality of beams are sequentially connected to one another such that they extend in different directions, and is capable of expanding and contracting in an axial direction. The axis of the expandable portion is bent to one side relative to a virtual line obtained by linearly connecting the one end and the other end of the expandable portion.
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