Probe, electrical connection device, and method for manufacturing probe
TW202638056APending Publication Date: 2026-09-16NIHON MICRONICS KK
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Patent Information
- Application Number
- TW114141738
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-11-20
- Filing Date
- 2025-10-28
- Publication Date
- 2026-09-16
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Figure TWG2TA001076361_001 
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Abstract
A probe of this present invention comprises: a distal portion having a distal end surface that faces toward an object to be inspected; an expandable portion, one end of which is connected to the distal portion; and a proximal portion connected to the other end of the expandable portion. The expandable portion includes a structure in which a plurality of beams are sequentially connected to one another such that they extend in different directions, and is capable of expanding and contracting in an axial direction. The axis of the expandable portion is bent to one side relative to a virtual line obtained by linearly connecting the one end and the other end of the expandable portion.
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