A probe and a test head having the same
TW202638057APending Publication Date: 2026-09-16LOMITES CO LTD
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Patent Information
- Application Number
- TW114145980
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-03-04
- Filing Date
- 2025-11-25
- Publication Date
- 2026-09-16
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Figure TWG2TA001076519_001 
Figure TWG2TA001076519_002 
Figure TWG2TA001076519_003
Abstract
The present invention discloses a probe and a test head having the probe. The probe includes a deformable portion extending longitudinally along a vertical direction. When testing a component under test, the deformable portion bends in a first direction perpendicular to the vertical direction. The deformable portion has a first side surface and a second side surface oppositely disposed along a second direction, and a third side surface and a fourth side surface oppositely disposed along the first direction. The second direction is perpendicular to the first direction and the vertical direction. The deformable portion has a first blind groove and a second blind groove, which respectively extend longitudinally along the vertical direction. The first blind groove is recessed from the first side surface toward the second side surface, and the second blind groove is recessed from the second side surface toward the first side surface. Both the first blind groove and the second blind groove are located between the third side surface and the fourth side surface. Furthermore, projected portions of the first blind groove and the second blind groove in the first direction overlap, thereby avoiding stress concentration and reducing the risk of the probe fracturing during bending deformation.
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