A probe and a test head having the same

TW202638057APending Publication Date: 2026-09-16LOMITES CO LTD
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Patent Information

Application Number
TW114145980
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-04
Filing Date
2025-11-25
Publication Date
2026-09-16

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    Figure TWG2TA001076519_003
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Abstract

The present invention discloses a probe and a test head having the probe. The probe includes a deformable portion extending longitudinally along a vertical direction. When testing a component under test, the deformable portion bends in a first direction perpendicular to the vertical direction. The deformable portion has a first side surface and a second side surface oppositely disposed along a second direction, and a third side surface and a fourth side surface oppositely disposed along the first direction. The second direction is perpendicular to the first direction and the vertical direction. The deformable portion has a first blind groove and a second blind groove, which respectively extend longitudinally along the vertical direction. The first blind groove is recessed from the first side surface toward the second side surface, and the second blind groove is recessed from the second side surface toward the first side surface. Both the first blind groove and the second blind groove are located between the third side surface and the fourth side surface. Furthermore, projected portions of the first blind groove and the second blind groove in the first direction overlap, thereby avoiding stress concentration and reducing the risk of the probe fracturing during bending deformation.
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