Probe head with contact probes having improved holding properties

Abstract

A probe head for testing a device under test is disclosed, said probe head having at least one contact probe comprising a body extended along a longitudinal axis between a first end portion and a second and opposite end portion, which are adapted to contact respective contact pads, and at least one guide comprising at least one guide hole for housing the contact probe, wherein the body of the contact probe comprises at least one longitudinal opening defining at least a first arm and a second arm separated by said opening and joined together at at least one junction region, and wherein the contact probe is configured to switch from a first configuration, in which it is not housed in the guide hole, to a second configuration, in which it is at least partially housed in the guide hole. In the second configuration, the opening extends at least partially inside the guide hole so that at least a portion of said first arm and a portion of said second arm is housed in said guide hole, wherein the contact probe comprises at least one elastic stopper formed by at least one section of at least one of said portion of said first arm and said portion of said second arm housed in said guide hole, said elastic stopper being elastically deformable in the passage between the first configuration, in which at said elastic stopper the contact probe has a first transverse diameter that is greater than a corresponding transverse diameter of the guide hole, and the second configuration, in which at said elastic stopper the contact probe has a second transverse diameter that is smaller than the first transverse diameter, the term transverse diameter meaning a maximum transverse dimension of a section, even not circular, taken according to a plane orthogonal to said longitudinal axis, and wherein, in the second configuration, said elastic stopper is deformed by contact with at least one wall of said guide hole and exerts a reaction force on said wall ensuring the retention of the contact probe.

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