Test head

Abstract

A test head comprising an insulating body and a probe is disclosed. The insulating body has a through hole extending vertically, wherein the through hole includes a first portion, a connecting portion, and a second portion sequentially connected from top to bottom. The connecting portion is offset to one side relative to the first and the second portion. The probe extends longitudinally in the vertical direction and includes a middle segment housed within the connecting portion. Its upper end protrudes upward from the first portion to abut a mating component, and its lower end protrudes downward from the second portion to abut a DUT. The probe passes through the through hole and makes multi-point contact with the inner wall. The middle segment undergoes bending deformation within the connecting portion. When the probe is subjected to pressure, the middle segment undergoes further bending deformation within the connecting portion.

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