Predictive process control for a manufacturing process

TW202638183APending Publication Date: 2026-09-16NANOTRONICS IMAGING INC
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Patent Information

Application Number
TW115121486
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2019-07-23
Filing Date
2020-06-24
Publication Date
2026-09-16

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Abstract

Aspects of the disclosed technology encompass the use of a deep learning controller for monitoring and improving a manufacturing process. In some aspects, a method of the disclosed technology includes steps for: receiving a plurality of control values from two or more stations, at a deep learning controller, wherein the control values are generated at the two or more stations deployed in a manufacturing process, predicting an intermediate or final output of an article of manufacture, based on the control values, and determining if the predicted intermediate or final output for the article of manufacture is in-specification. In some aspects, the process can further include steps for generating control inputs if the predicted intermediate or final output for the article of manufacture is not in-specification. Systems and computer-readable media are also provided.
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