Method for monitoring abnormality, electronic device and storage medium

TW202638184APending Publication Date: 2026-09-16HON HAI PRECISION INDUSTRY CO LTD
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Patent Information

Application Number
TW114111902
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-14
Filing Date
2025-03-27
Publication Date
2026-09-16

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Abstract

The present application relates to a field of industrial technology, and provides a method for monitoring abnormality, an electronic device and a storage medium. The method includes: based on operation data of a production device, determining detection results of the production device; obtaining air pressure data of a end effector in a robot according to the detection results; detecting whether the robot is abnormal according to the air pressure data. The present application can monitor the abnormal situation of the production device in time, thereby improving the reliability of the production device.
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