Method for forming capacitor, semiconductor device, module, and electronic device
TW202638766APending Publication Date: 2026-09-16SEMICON ENERGY LAB CO LTD
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Patent Information
- Application Number
- TW115112419
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2015-10-30
- Filing Date
- 2016-10-18
- Publication Date
- 2026-09-16
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Figure TWG2TA001077364_001 
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Abstract
A miniaturized transistor is provided. A transistor with low parasitic capacitance is provided. A transistor having high frequency characteristics is provided. A transistor having a large amount of on-state current is provided. A semiconductor device including the transistor is provided. A semiconductor device with high integration is provided. A novel capacitor is provided. The capacitor includes a first conductor, a second conductor, and an insulator. The first conductor includes a region overlapping with the second conductor with the insulator provided therebetween. The first conductor includes tungsten and silicon. The insulator includes a silicon oxide film that is formed by oxidizing the first conductor.
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