Etching composition, etching method, and method for manufacturing semiconductor substrate

TW202639810APending Publication Date: 2026-10-01TOKYO OHKA KOGYO CO LTD
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Patent Information

Application Number
TW114150504
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-23
Filing Date
2025-12-22
Publication Date
2026-10-01
Patent Text Reader

Abstract

The present invention provides an etching composition, an etching method, and a method for manufacturing a semiconductor substrate. The etching composition contains (A) an oxidant, (B) a compound or salt thereof capable of releasing fluoride ions, (C) at least one amine compound selected from the group consisting of amine compounds (c1), (c2), (c3), piperazine, 1,5,9-triazacyclododecane, 1,4,7-triazacyclononane, tetraazacyclododecane, tetraazacyclotetradecane, tetraethylpentamine, and polyethylimide and their derivatives, and (D) an etching inhibitor.
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