Acoustic-optical metrology system and method for characterizing a sample and non-transitory computer readable medium
TW202640122APending Publication Date: 2026-10-01NOVALTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- TW114148740
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-11
- Filing Date
- 2025-12-11
- Publication Date
- 2026-10-01
Smart Images

Figure TWG2TA001078777_001 
Figure TWG2TA001078777_002 
Figure TWG2TA001078777_003
Abstract
Systems and methods of optical metrology and inspection are provided, including shaping a pump pulse to have a concave wavefront that generates, in a sample, an acoustic wave that converges at a focal location. When a subsurface feature is at the focal location, a reflected acoustic wave is generated, with a convex acoustic wavefront. A probe assembly is configured to shape a probe pulse to have a spherical wavefront and to impinge on the surface simultaneously with the return to the surface of a reflected acoustic wave. A detection assembly is configured to receive a reflected probe pulse, reflected from the surface, and, responsively, to determine whether the reflected probe pulse is indicative of surface changes induced by a reflected acoustic wave from a subsurface feature at the focal location.
Need to check novelty before this filing date? Find Prior Art
