A probe card, a testing device, and a testing method
TW202640152APending Publication Date: 2026-10-01WUXI HONGXIN YOU TECHNOLOGY CO LTD
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Patent Information
- Application Number
- TW114150892
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-24
- Filing Date
- 2025-12-23
- Publication Date
- 2026-10-01
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Abstract
This invention provides a probe card, a testing device, and a testing method, relating to the field of probe card testing technology. The probe card has an embedded fiber optic interface that corresponds to the optical gate of the device under test (DUT), enabling functional testing by connecting the fiber optic interface to the optical gate. The probe card, testing device, and testing method provided by this invention, by embedding the fiber optic interface within the probe card, achieve multi-site testing and reduce setup time.
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