Contact-type temperature control testing device, method of controlling temperature, and temperature controlling system

TW202640160APending Publication Date: 2026-10-01MPI CORP
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Patent Information

Application Number
TW115107730
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-05
Filing Date
2026-03-04
Publication Date
2026-10-01

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    Figure TWG2TA001079441_003
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Abstract

A contact-type temperature control testing device, which directly contacts a test object and controls its temperature, includes a low-temperature module, a high-temperature module, and a spacing adjustment member. The low-temperature module provides a preset low temperature. The high-temperature module is located adjacent to the low-temperature module and includes a high-temperature source and a base. The high-temperature source is disposed on the base and provides a preset high temperature. A surface of the base directly contacts the test object, and a preset temperature is conducted to the test object by the low-temperature module and / or the high-temperature source. The spacing adjustment member has one end, which is connected to the low-temperature module, and the other end, which is disposed on the high-temperature module. The spacing adjustment member is configured to adjust a mechanical coupling condition between the low-temperature module and the high-temperature module in response to a temperature change of the high-temperature source.
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