Semiconductor system, method for operating semiconductor system and method for scan signal rerouting

Abstract

A semiconductor system includes a plurality of dies arranged on a substrate and each including a core, a first multiplexer, a clock multiplexer, and a plurality of output circuits. The core is performs scan test operations. The first multiplexer receives scan data and control signals from at least one neighboring die and provides the scan data and control signals to the core. The clock multiplexer receives scan clock signals from at least one neighboring die and provides a selected scan clock signal to the core. Each output circuit includes an output multiplexer and a pipeline flip-flop and transmits scan data and control signals from the core to a neighboring die. The output multiplexer is coupled to the core. The pipeline flip-flop is coupled to the output multiplexer.

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