Configuring integrated-circuit systems

TW202640388APending Publication Date: 2026-10-01ARM LTD
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Patent Information

Application Number
TW115109159
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-26
Filing Date
2026-03-12
Publication Date
2026-10-01

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Abstract

is accessed that assigns each of the plurality of nodes to a respective local cache region of a plurality of local cache regions. Defect data is accessed that identifies one or more of the nodes as being defective. For a first node of the plurality of nodes that is identified as being defective by the defect data: a first local cache region is identified, to which the first node is assigned by the first assignment data; a distance metric is used to identify
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