Methods and procedures for evaluating semiconductor devices by operating text columns

Abstract

The purpose of this disclosure is to provide a technique for obtaining instructions for an evaluation device for evaluating a semiconductor device from a language model by inputting textual input to that language model. The method disclosed herein involves inputting instructions for the evaluation device for a semiconductor device into a language model and receiving specification data describing the operational specifications of the evaluation device from the language model. The language model is pre-tuned based on at least one of domain knowledge of the semiconductor device or domain knowledge of the evaluation device.

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