Semiconductor device and method for fabricating the same
TW202641004APending Publication Date: 2026-10-01SK HYNIX INC
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Patent Information
- Application Number
- TW114142857
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-13
- Filing Date
- 2025-11-04
- Publication Date
- 2026-10-01
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Abstract
A semiconductor device including high-integrated memory cells and a method for fabricating the semiconductor device are provided. The method for fabricating a semiconductor device includes forming an alternating stack of sacrificial pad sheets and inter-pad dielectric layers, which are stacked vertically spaced apart from each other over a substrate; forming preliminary contact holes penetrating the alternating stack; forming sacrificial plugs filling the preliminary contact holes; performing post-treatment processes on the sacrificial plugs and forming sacrificial plug patterns having different heights and sacrificial recesses having different depths; forming contact liner layers on sidewalls of the sacrificial recesses; removing the sacrificial plug patterns and forming contact holes; forming contact plugs filling the contact holes; removing the sacrificial pad sheets and forming pad openings; and forming each pad of a plurality of pads in a different one of the pad openings.
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