Semiconductor device and method for fabricating the same

TW202641030APending Publication Date: 2026-10-01UNITED MICROELECTRONICS CORP
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Patent Information

Application Number
TW114111485
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Filing Date
2025-03-26
Publication Date
2026-10-01

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Abstract

A method for fabricating resistive random access memory (RRAM) includes the steps of first forming an interlayer dielectric (ILD) layer on a substrate, forming a contact plug in the ILD layer, forming a RRAM element on the contact plug, forming a first cap layer and a second cap layer on the RRAM element, and removing part of the second cap layer to form a spacer.
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