Power mosfet device with source embedded heteroepitaxy and their fabrication methods

TW202641050APending Publication Date: 2026-10-01重庆万国半导体科技有限公司
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Patent Information

Application Number
TW114143079
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-28
Filing Date
2025-11-05
Publication Date
2026-10-01

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Abstract

This invention discloses a power MOSFET device with a source region embedded in heteroepitaxial growth and its manufacturing method. The manufacturing method includes: growing an epitaxial layer on a silicon substrate and forming a trench gate structure; implanting to form the body region; etching to form the source recess; growing heteroepitaxial material to fill the source recess and form the source region; forming the source contact and creating an ohmic contact region at the bottom of the source contact; and completing subsequent manufacturing processes. In this invention, the source region is formed by embedding heteroepitaxial growth. The different lattice constants of the heteroepitaxial material and silicon material generate the required elastic deformation, applying corresponding local stress to the silicon near the conduction channel in the source-drain direction. This increases the carrier mobility in the source-drain direction, further reducing the on-resistance of the power MOSFET device and decreasing power consumption.
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