Semiconductor structure having upper surface and method of fabrication

TW202641083APending Publication Date: 2026-10-01TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information

Application Number
TW114118551
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-03-20
Filing Date
2025-05-16
Publication Date
2026-10-01

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    Figure TWG2TA001078148_003
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Abstract

Semiconductor structures and methods of fabrication are provided. A method includes forming a trench over a semiconductor substrate, wherein the trench has a trench sidewall; forming a semiconductor liner on the trench sidewall; converting at least a portion of the semiconductor liner to a metal-semiconductor intermetallic; forming a first conductive contact in the trench, wherein the first conductive contact contacts the metal-semiconductor intermetallic; and forming a second conductive contact adjacent to the metal-semiconductor intermetallic.
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