Apparatuses and methods for etching process

TW202641293APending Publication Date: 2026-10-01TOKYO ELECTRON LTD
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Patent Information

Application Number
TW114146552
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-02
Filing Date
2025-11-28
Publication Date
2026-10-01

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Abstract

A method is provided for an etching process. The method includes dispensing a liquid electrolyte layer over a layer-to-be-etched on a substrate. A first electrode is coupled to the substrate, and a second electrode is coupled to the liquid electrolyte layer. An alternating voltage is applied at different frequencies between these electrodes. Impedance data is collected in response to the alternating voltage. The etching process is then performed with an etching parameter selected based on the collected impedance data, allowing for precise control and improved uniformity of the layer-to-be-etched.
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