Resin composition, transfer film, cured material, laminate, manufacturing method of cured material, manufacturing method of laminate, manufacturing method of semiconductor device and semiconductor device
TW202641886APending Publication Date: 2026-10-16FUJIFILM CORP
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Patent Information
- Application Number
- TW115109679
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-11-19
- Filing Date
- 2026-03-16
- Publication Date
- 2026-10-16
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Figure TWG2TA001081219_001 
Figure TWG2TA001081219_002
Abstract
The present invention aims to provide a resin composition, transfer film, cured material, laminate, method for manufacturing the cured material, method for manufacturing the laminate, method for manufacturing a semiconductor device, and semiconductor device capable of forming a cured material with excellent flatness and excellent adhesion and mechanical strength even after exposure to high temperature and high humidity environments. The resin composition of the present invention contains polyimide resin, a compound having a free radical polymerizable group, and a halogen element, wherein the halogen element content is 0.001 to 300 ppm relative to the total mass of the total solid components of the resin composition.
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