Chemical mechanical polishing slurry

TW202641939APending Publication Date: 2026-10-16ANJI MICROELECTRONICS TECH (SHANGHAI) CO LTD
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Patent Information

Application Number
TW114150291
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-12-31
Filing Date
2025-12-19
Publication Date
2026-10-16
Patent Text Reader

Abstract

The invention provides a chemical mechanical polishing slurry comprising: abrasive and organic phosphonic acid compounds. The slurry with the addition of organic phosphonic acid compounds has a low removal rate of phenolic resin-based hard masks and a high selectivity of SiO2to hard mask which can stop on the phenolic resin-based hard mask material.
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