Silver-gold alloy bump structure, method for fabricating the same, and semiconductor device
TW202642014APending Publication Date: 2026-10-16XIAMEN TONGFU MICROELECTRONICS CO LTD
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Patent Information
- Application Number
- TW115111890
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-04-08
- Filing Date
- 2026-03-26
- Publication Date
- 2026-10-16
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Figure TWG2TA001081301_001 
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Figure TWG2TA001081301_003
Abstract
The present invention provides a silver- gold alloy bump structure, method for fabricating the same, and semiconductor device. The method comprises: providing a semiconductor device; sequentially forming a TiW seed layer and an Au seed layer on a pad of the semiconductor device; forming a barrier layer on the Au seed layer; and forming a gold-silver alloy bump on the barrier layer. The barrier layer is configured to prevent metallic silver in the gold-silver alloy bump from diffusing into the Au seed layer. During the fabrication process of the gold-silver alloy bump structure, the barrier layer is formed on the Au seed layer before the gold-silver alloy bump is formed on the barrier layer. The barrier layer can block the diffusion of metallic silver from the gold-silver alloy bump into the Au seed layer, thereby ameliorating the issue of poor adhesion between the gold-silver alloy bump and the seed layer. This enhances the reliability of the gold-silver alloy bump structure, consequently improving the reliability of the semiconductor device.
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