Test socket

Abstract

The present invention is a test socket, comprising a base having a first surface and a second surface opposite to each other and a plurality of through holes, a first conductive elastic sheet located on the first surface, and a plurality of elastic metal parts in each of the through holes. A top contact unit of each of the elastic metal parts has a recess, and the first conductive elastic sheet has a plurality of bump corresponding to each of the elastic metal parts. The recess is suitable for accommodating the bump and electrically connecting the bump during the test process of the test socket. In particular, the bump is accommodated by the recess, the design of the recess and the bump allows the first conductive elastic sheet and each of the elastic metal parts to maintain a good resistance value.

Description

[Technical Field]

[0001] This invention relates to semiconductor testing technology, and more particularly to a test socket. [Previous Technology]

[0002] In semiconductor packaging testing, a test socket with multiple probes is usually used to place the test object, such as a semiconductor package or a chip, into the socket. After the probes are electrically connected to the semiconductor package or chip, the test signal is transmitted to the semiconductor package or chip through each probe to achieve the purpose of testing.

[0003] As testing conditions become increasingly stringent, the requirements for signal quality during testing are becoming higher and higher. Therefore, shortening the transmission path or improving the contact between contact interfaces has become an industry development goal. In traditional testing, the probe tip is often spherical or needle-shaped. Because both the test probe and the conductive block of the test object are solid hard metals, they are connected by point contact, resulting in poor contact and instability. Subsequently, some technologies have proposed setting up elastic conductive elements between the test probe and the test object to reduce the contact relationship between them. However, there are still areas for improvement. For example, if the tip of the probe is designed as a spike, although it can enhance the contact with the elastic conductive element, it may pierce into the elastic conductive element and cause damage to it. Over time, this will also affect the conductivity. Alternatively, if the tip of the probe is designed as a rounded tip, although it reduces damage to the elastic conductive element, when the probe contacts the elastic conductive element, the rounded tip will compress the elastic conductive element, making it difficult for conductive particles to accumulate at the point of compression, which may increase the contact resistance and affect the test results.

[0004] In view of the above problems, how to provide a test socket, in particular, that can provide good contact stability between the probe and the test object, while maintaining good contact resistance, has become the goal that those skilled in the art are eager to pursue. [Summary of the Invention]

[0005] To solve the problems of the prior art, the present invention discloses a test holder, comprising: a base having a first surface and a second surface opposite to each other and a plurality of through holes communicating with the first surface and the second surface; a first conductive elastic sheet located on the first surface of the base and having a plurality of protrusions respectively corresponding to the plurality of through holes on one side facing the plurality of through holes; and a plurality of elastic metal members respectively disposed in the plurality of through holes, wherein the top contact unit of each elastic metal member has a recess, the recess being adapted to accommodate the protrusion and electrically connect it when the test holder is performing a test.

[0006] In one embodiment, the first conductive elastic sheet includes a plurality of conductive elastic regions corresponding to each of the plurality of elastic metal parts and a plurality of conductive particles distributed in each of the conductive elastic regions.

[0007] In one embodiment, the protrusion is substantially planar at the point where it contacts the recess and has a connecting end cross-sectional width, a contact end cross-sectional width, and a protrusion height. The recess has a recess height and the recessed area of ​​the recess has a recess cross-sectional width, wherein the recess cross-sectional width is greater than the contact end cross-sectional width and the protrusion height is greater than the recess height.

[0008] In the foregoing embodiments, the product of the recess height and the recess cross-sectional width, multiplied by the width of the connecting end cross-section plus the width of the contact end cross-section and then by the protrusion height, is less than 40%.

[0009] In one embodiment, the test base includes a second conductive elastic sheet disposed on the second surface, the second conductive elastic sheet having protrusions corresponding to each of the plurality of through holes, and the bottom contact unit of each of the elastic metal parts is not exposed from the base.

[0010] In one embodiment, the second conductive elastic sheet is locked or adhered to the second surface.

[0011] In one embodiment, the first conductive elastic sheet is floated on the first surface.

[0012] In one embodiment, when viewed from above, the recessed area is a continuous surface.

[0013] In one embodiment, the test holder is adapted to be disposed on a circuit board, and each of the through holes is a straight through hole, so that when the test holder is fixed to the circuit board, each of the elastic metal parts in each of the through holes is in an unpressurized state.

[0014] In one embodiment, the elastic metal member is a signal needle and includes at least a cylindrical portion, a spring located within the cylindrical portion, a bottom contact unit and the top contact unit.

[0015] In the foregoing embodiment, the end face of the cylindrical portion defines the top contact unit.

[0016] In the foregoing embodiments, the bottom contact unit and the top contact unit have substantially the same structure.

[0017] In the foregoing embodiment, the outer diameter width of the bottom contact unit is approximately equal to the outer diameter width of the cylindrical portion.

[0018] In the foregoing embodiments, the base is made of metal and has an insulating layer disposed in the through hole and surrounding the elastic metal part.

[0019] The present invention further discloses a test fixture, comprising: a base having a first surface and a second surface opposite to each other and a plurality of through holes communicating with the first surface and the second surface; a first conductive elastic sheet located on the first surface of the base and having a plurality of protrusions respectively corresponding to the plurality of through holes on one side facing the plurality of through holes; and a plurality of elastic metal members respectively disposed in the plurality of through holes, wherein the top contact unit of each elastic metal member has a disc-shaped region surrounded by a slope with a low center point and a high outer edge, the disc-shaped region accommodating the protrusion and electrically connected when the test fixture is tested, wherein in the longitudinal section of the top contact unit, the slope is an obtuse angle at the center point.

[0020] In one embodiment, the first conductive elastic sheet includes a plurality of conductive elastic regions corresponding to each of the plurality of elastic metal parts and a plurality of conductive particles distributed in each of the conductive elastic regions.

[0021] In one embodiment, the part of the protrusion that contacts the dish-shaped region is substantially planar and has a connecting end cross-sectional width, a contact end cross-sectional width and a protrusion height. The dish-shaped region has a recess height and a recess cross-sectional width, wherein the recess cross-sectional width is greater than the contact end cross-sectional width and the protrusion height is greater than the recess height.

[0022] In the foregoing embodiments, the product of the recess height and the recess cross-sectional width, multiplied by the width of the connecting end cross-section plus the width of the contact end cross-section and then by the protrusion height, is less than 40%.

[0023] In one embodiment, the test base includes a second conductive elastic sheet disposed on the second surface, the second conductive elastic sheet having a protrusion corresponding to each of the plurality of through holes, and the bottom contact unit of each of the elastic metal parts is not exposed from the base.

[0024] In one embodiment, the second conductive elastic sheet is locked or adhered to the second surface.

[0025] In one embodiment, the first conductive elastic sheet is floated on the first surface.

[0026] In one embodiment, the disc-shaped region is a continuous surface when viewed from above.

[0027] In one embodiment, the test holder is adapted to be disposed on a circuit board, and each of the through holes is a straight through hole, so that when the test holder is fixed to the circuit board, each of the elastic metal parts in each of the through holes is in an unpressurized state.

[0028] In one embodiment, the elastic metal member is a signal needle and includes at least a cylindrical portion, a spring located within the cylindrical portion, a bottom contact unit and the top contact unit.

[0029] In the foregoing embodiment, the end face of the cylindrical portion defines the top contact unit.

[0030] In the foregoing embodiments, the bottom contact unit and the top contact unit have substantially the same structure.

[0031] In the foregoing embodiment, the outer diameter width of the bottom contact unit is approximately equal to the outer diameter width of the cylindrical portion.

[0032] In the foregoing embodiments, the base is made of metal and has an insulating layer disposed in the through hole and surrounding the elastic metal part.

[0033] As can be seen from the above, the test fixture of the present invention has a concave portion at the top contact unit of the elastic metal part, and a protrusion at the corresponding conductive elastic sheet of the elastic metal part. During the test, the concave portion can accommodate the protrusion, which not only increases the contact area between the two, but also has the effect of gathering conductive particles in the conductive elastic sheet. In particular, the elastic metal part adopts a concave design, which will not pierce the conductive elastic sheet during the contact process, thus reducing the possibility of damage to the conductive elastic sheet. Accordingly, it can not only improve the life of the conductive elastic sheet, but also not affect the contact resistance value, thus providing a stable test effect. [Simplified Explanation of the Diagram]

[0058] Figure 1 is a cross-sectional view of the test stand of the present invention.

[0059] Figure 2 is a schematic diagram of the conductive elastic sheet of the present invention in contact with the elastic metal part.

[0060] Figure 3 is a cross-sectional view of an embodiment of the test stand of the present invention.

[0061] Figure 4 is a schematic diagram showing the corresponding proportions of the conductive elastic sheet and the elastic metal part of the present invention.

[0062] Figure 5 is a top view of the recess of the elastic metal part of the present invention.

[0063] Figure 6 is a top view of another embodiment of the recess of the elastic metal part of the present invention.

[0064] Figure 7 is a cross-sectional view of another embodiment of the test stand of the present invention.

[0065] Figure 8 is a structural diagram of the elastic metal part of the present invention.

[0066] Figures 9A to 9C are structural diagrams of different types of elastic metal parts of the present invention.

[0067] Figure 10 is a schematic diagram of the various elastic metal parts of the present invention located in the test seat.

Implementation Method

[0034] The technical content of the present invention will be described below through specific embodiments. Those skilled in the art can easily understand the advantages and effects of the present invention from the content disclosed in this specification. However, the present invention can also be implemented or applied through other different embodiments.

[0035] Figure 1 is a cross-sectional view of the test base of the present invention, and Figure 2 is a schematic diagram of the conductive elastic sheet of the present invention contacting the elastic metal component. As shown in the figures, the test base 1 of the present invention includes a base 11, a first conductive elastic sheet 12 located above the base 11, and a plurality of elastic metal components 13 disposed in the base 11. In a specific embodiment, the test base 1 of the present invention may be a probe holder or a probe card, and may be disposed on a test device 4, so that each of the elastic metal components 13 receives a test signal from the test device 4. The elastic metal component 13 may be a spring probe, and the test device 4 may be, for example, a circuit board.

[0036] The base 11 has a first surface 111 and a second surface 112 opposite to each other and a plurality of through holes 113 connecting the first surface 111 and the second surface 112. The first conductive elastic sheet 12 includes a first contact surface 121 and a second contact surface 122 opposite to each other and is located on the first surface 111 of the base 11. The first contact surface 121 facing the plurality of through holes 113 has a plurality of protrusions 123 respectively corresponding to the plurality of through holes 113. Each elastic metal member 13 is respectively disposed in each of the through holes 113. Each elastic metal member 13 has a top contact unit 131 and the top contact unit 131 has a recess 1311. The recess 1311 is adapted to accommodate the protrusion 123 and electrically connect it when the test seat 1 is tested. In other words, the elastic metal part 13 has a recess 1311 at one end facing the first conductive elastic sheet 12, and the first conductive elastic sheet 12 has a protrusion 123 on the side facing the elastic metal part 13. These protrusions 123 protrude toward these through holes 113. The two are corresponding to each other and can contact and be electrically connected when the test seat 1 is tested.

[0037] In one embodiment, the first conductive elastic sheet 12 can be placed and floated on the first surface 111 through a guide post without locking, and the test element 2 is set above it for element testing. That is, each of the elastic metal parts 13 transmits the test signal from the test device 4 to the test element 2 through the first conductive elastic sheet 12.

[0038] Further, the first conductive elastic sheet 12 includes a plurality of conductive elastic regions R corresponding to each of the plurality of elastic metal parts 13 and a plurality of conductive particles 124 distributed in each of the conductive elastic regions R. Specifically, the first conductive elastic sheet 12 has conductive particles 124 distributed only in each of the conductive elastic regions R, and the other areas do not have conductive particles 124. That is, each conductive elastic region R can form a kind of conductive elastic pad (bump pad), providing electrical conduction at both ends, which can avoid short circuits between adjacent conductive paths.

[0039] When the test seat 1 is tested, the protrusion 123 contacts the top contact unit 131 and is accommodated in the recess 1311, as shown in Figure 2. Based on the concave shape of the recess 1311, the protrusion 123 can more closely contact the top contact unit 131, making the electrical connection between the two more stable. Specifically, based on the concave shape of the recess 1311, when the conductive particles 124 in the region of the protrusion 123 are accommodated in the recess 1311, the conductive particles 124 will gather towards the center of the protrusion 123 because the center point of the recess 1311 is low, and will not diffuse outward due to compression. This will make the conductive path formed in the conductive elastic region R more stable.

[0040] Figure 3 is a cross-sectional view of an embodiment of the test base of the present invention. As shown in the figure, since the upper and lower ends of the through hole 113 of the base 11 have a stepped structure (that is, a design with different hole diameters), when the test base 1 is fixed on the test device 4, it will push the elastic metal part 13 upward, and the shoulder of the elastic metal part 13 (the connection between the top contact unit 131 and the cylindrical part) will be squeezed by the stepped structure. At this time, the base 11 may warp. The warping shown in the figure is that the middle is warped upward. At this time, the elastic metal part 13 may present different heights due to the warping. Accordingly, since the first conductive elastic sheet 12 is an elastic body, it can conform to the shape defined by several elastic metal parts 13 of different heights. That is to say, when the base 11 is warped, the shape defined by several elastic metal parts 13 of different heights (e.g., an inverted smile curve) can be floated on the base 11 by conforming to the shape through the first conductive elastic sheet 12.

[0041] Figure 4 is a schematic diagram showing the corresponding proportions of the conductive elastic sheet and the elastic metal part of the present invention. Please refer to Figure 1 as well. As shown in the figure, the conductive elastic area R of the first conductive elastic sheet 12 has a conductive cross-sectional width A, and the top contact unit 131 has a top cross-sectional width B. Further, the protrusion 123 is essentially a plane at the recess 1311 of the top contact unit 131, and has a connecting end cross-sectional width F, a contact end cross-sectional width E, and a protrusion height G. The recess 1311 has a recess height D, and the recessed area of ​​the recess 1311 has a recess cross-sectional width C. In order to make the contact area between the protrusion 123 and the recess 1311 larger and achieve good conductivity, the dimensions between the two can be designed such that the recess cross-sectional width C is greater than the contact end cross-sectional width E and the protrusion height G is greater than the recess height D. Under this design condition, the protrusion 123 will be subjected to a better squeezing effect, and the purpose of conductive particle aggregation can be achieved to obtain good electrical conduction.

[0042] Further, after multiple experiments, the proportional relationship between the recess 1311 and the bump 123 can be further defined, while maintaining a good contact resistance value. The proportional relationship is that the product of the recess height D and the recess cross-sectional width C, the cross-sectional width F of the connecting end plus the cross-sectional width E of the contact end, and the bump height G are less than 40%, that is, the formula is.

[0043] The above is only a preferred embodiment and is not intended to limit the proportional relationship between the recess 1311 and the protrusion 123 of the present invention.

[0044] Figure 5 is a top view of the recess of the elastic metal part of the present invention. As shown in the figure, the recess 1311 is disc-shaped to facilitate the placement of the protrusion of the first conductive elastic sheet therein. Furthermore, when the recess 1311 is viewed from above, the recessed area of ​​the recess 1311 is a continuous surface, that is, the whole is a smooth continuous surface.

[0045] In other embodiments, the recessed area of ​​the top contact unit can be defined as a dish-shaped area surrounded by a slope with a low center point and a high outer edge. Further, as shown in FIG4, in the longitudinal section of the top contact unit, the slope is obtuse at the center point, that is, in the longitudinal section, the angle at the central recess is obtuse.

[0046] Figure 6 is a top view of another embodiment of the recess of the elastic metal part of the present invention. As shown in the figure, the recessed area of ​​the recess 1311 may contain several grooves 1312. Taking three grooves 1312 as an example, the grooves 1312 will be lower than the original recess height. Therefore, unlike the recessed area in Figure 5 which is a continuous surface, in this embodiment, when the recess 1311 is viewed from above, the entire recessed area is a discontinuous surface. That is, the grooves 1312 are located at a lower position. Therefore, the plane of the entire recessed area will not be a smooth surface. It should be noted that no matter how the recess 1311 is designed, it must meet the aforementioned dimensional requirements, that is, the width C of the recessed section is greater than the width E of the contact end section and the height G of the protrusion is greater than the height D of the recess.

[0047] Figure 7 is a cross-sectional view of another embodiment of the test seat of the present invention, and Figure 8 is a structural diagram of the elastic metal part of the present invention. Please refer to both figures.

[0048] As shown in FIG8, the elastic metal part 13 may be a signal needle and includes at least a cylindrical part 133, a spring 134 located in the cylindrical part, a bottom contact unit 132 and a top contact unit 131. In this embodiment, the top contact unit 131 has a recess 1311 to provide a better contact area with the conductive elastic sheet.

[0049] As shown in FIG7, the test base 1 further includes a second conductive elastic sheet 14 disposed on the second surface 112 of the base 11. The second conductive elastic sheet 14 may also have a protrusion 141 corresponding to each of the plurality of through holes 113. Each of the elastic metal parts 13 has a bottom contact unit 132, and the bottom contact unit 132 is not exposed from the base 11. That is, the bottom surface of the through hole 113 is closed by the second conductive elastic sheet 14, so that the elastic metal parts 13 are not exposed.

[0050] In this embodiment, each through hole 113 can be a straight through hole, so that when the test base 1 is fixed to the test device 4 (as shown in Figure 1, for example, a circuit board), each of the elastic metal parts 13 in each through hole 113 is in an unpre-compressed state. In other words, with the through hole 113 being a straight through hole design, the through hole 113 will not have a small or large diameter design, so there will be no situation where the elastic metal part 13 is pressed against a small diameter (as shown in Figure 3). Therefore, the elastic metal part 13 is in an unpre-compressed state, which can prevent the base 11 from warping.

[0051] Furthermore, the second conductive elastic sheet 14 is disposed at the bottom of the base 11, so that the upper and lower ends of the through hole 113 form an accommodating space due to the arrangement of the first conductive elastic sheet 12 and the second conductive elastic sheet 14, providing space for the elastic metal part 13 to be placed therein. In particular, the second conductive elastic sheet 14 provides an electrical connection between the elastic metal part 13 and the testing device 4 (as shown in Figure 1). Based on the fact that the second conductive elastic sheet 14 is an elastic conductor, its protrusion 141 is designed to also have a good contact effect with the bottom contact unit 132.

[0052] In one embodiment, the second conductive elastic sheet 14 can be fixed to the second surface 112 of the base 11 by locking or adhesive.

[0053] Figures 9A to 9C are structural diagrams of different types of elastic metal parts of the present invention, and Figure 10 is a schematic diagram of various types of elastic metal parts of the present invention located in the test seat. As shown in Figure 9A, it is a four-piece single-acting needle including a top contact unit 131, a bottom contact unit 132, a cylindrical part 133 and a spring 134. The front end of the top contact unit 131 is designed with a recess. The outer diameter width of the bottom contact unit 132 is approximately equal to the outer diameter width of the cylindrical part 133. Therefore, its deflection can be limited within a single through hole 113 (for example, as shown in Figure 7), avoiding the phenomenon of needle jamming during pressure testing.

[0054] As shown in Figure 9B, a three-piece single-acting needle includes a top contact unit 131, a bottom contact unit 132, a cylindrical portion 133, and a spring 134. The end face of the cylindrical portion 133 defines the top contact unit 131, meaning the top contact unit 131 is an extension of the cylindrical portion 133. Similarly, the outer diameter of the bottom contact unit 132 is approximately equal to the outer diameter of the cylindrical portion 133, thus limiting its deflection within a single through-hole 113 (e.g., as shown in Figure 7). Furthermore, the top contact unit 131 and the cylindrical portion 133 are substantially the same size, making it easy to adjust high-frequency impedance control.

[0055] As shown in Figure 9C, it is a four-piece double-acting needle including a top contact unit 131, a bottom contact unit 132, a cylinder 133 and a spring 134. The top contact unit 131 and the bottom contact unit 132 have essentially the same structure, that is, the top contact unit 131 and the bottom contact unit 132 are designed with the same size. Thus, when assembling the needle, there is no need to consider the front and back sides. In addition, there is no need to consider the front and back sides during the needle implantation process.

[0056] In one embodiment, the base 11 may be made of metal, and accordingly, the base 11 may have an insulating layer 114. The insulating layer 114 is disposed within the through hole 113 and surrounds the elastic metal member 13, which can prevent the base 11 from contacting the elastic metal member 13 and causing conductivity during the test, as shown by the elastic metal members 13 on the left and right sides of FIG10. In addition, the elastic metal member 13 in the middle of FIG10 is a grounding probe, and the conductive elastic area below it is larger than the hole diameter, that is, the conductive elastic area will contact the hole wall of the through hole 113 to improve the grounding effect.

[0057] The above embodiments are merely illustrative and not intended to limit the present invention. Any person skilled in the art can modify and alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention is defined by the appended claims, and should be covered by this disclosure as long as it does not affect the effects and purpose of the present invention.

Claims

1. A test socket, comprising: A base having opposing first and second surfaces and a plurality of through holes connecting the first and second surfaces; a first conductive elastic sheet located on the first surface of the base and having a plurality of protrusions corresponding to the plurality of through holes on one side facing the plurality of through holes; and a plurality of elastic metal members disposed in the plurality of through holes, wherein the top contact unit of each elastic metal member has a recess, the recess being adapted to accommodate and electrically connect the protrusion when the test seat is tested, wherein the protrusion contacting the recess is substantially planar and has a connecting end cross-sectional width, a contact end cross-sectional width, and a protrusion height, the recess has a recess height, and the recessed area of ​​the recess has a recess cross-sectional width, wherein the recess cross-sectional width is greater than the contact end cross-sectional width, and the protrusion height is greater than the recess height.

2. The test fixture as described in request item 1, wherein, The first conductive elastic sheet includes a plurality of conductive elastic regions corresponding to each of the plurality of elastic metal parts, and a plurality of conductive particles distributed within each of the conductive elastic regions.

3. The test fixture as described in request item 1, wherein, The product of the recess height and the recess cross-sectional width, multiplied by the sum of the width of the connecting end cross-section and the width of the contact end cross-section, and then multiplied by the protrusion height, is less than 40%.

4. The test fixture as described in claim 1 further includes a second conductive elastic sheet disposed on the second surface, the second conductive elastic sheet having protrusions corresponding to each of the plurality of through holes, and the bottom contact unit of each of the elastic metal parts not exposed from the base.

5. The test socket as described in claim 4, wherein, The second conductive elastic sheet is locked or adhered to the second surface.

6. The test fixture as described in claim 1, wherein, The first conductive elastic sheet is floated on the first surface.

7. The test fixture as described in Request 1, wherein, When viewed from above, the recessed area of ​​the recess is a continuous surface.

8. The test fixture as described in claim 1, wherein, The test socket is adapted to be mounted on a circuit board, and each of the through holes is a straight through hole, so that when the test socket is fixed to the circuit board, each of the elastic metal parts in each of the through holes is in an unpressurized state.

9. The test socket as described in claim 1, wherein, The elastic metal component is a signal needle and includes at least one cylindrical portion, a spring located within the cylindrical portion, a bottom contact unit, and a top contact unit.

10. The test fixture as described in claim 9, wherein, The end face of the cylinder defines the top contact unit.

11. The test fixture as described in claim 9, wherein, The bottom contact unit and the top contact unit have essentially the same structure.

12. As in the test socket of request item 9, where, The outer diameter of the bottom contact unit is approximately equal to the outer diameter of the cylindrical section.

13. A test stand, comprising: A base has opposing first and second surfaces and a plurality of through holes connecting the first and second surfaces; a first conductive elastic sheet is located on the first surface of the base and has a plurality of protrusions corresponding to the plurality of through holes on one side facing the plurality of through holes; and a plurality of elastic metal members are respectively disposed in the plurality of through holes, wherein the top contact unit of each elastic metal member has a recess, the recess being adapted to accommodate the protrusion and electrically connect it when the test seat is tested, wherein the base is made of metal and has an insulating layer disposed in the through holes and surrounding the elastic metal member, and the elastic metal member is a signal needle and includes at least one cylindrical portion, a spring located in the cylindrical portion, a bottom contact unit and the top contact unit.

14. A test stand, comprising: A base has opposing first and second surfaces and a plurality of through holes connecting the first and second surfaces; a first conductive elastic sheet is located on the first surface of the base and has a plurality of protrusions corresponding to the plurality of through holes on one side facing the plurality of through holes; and a plurality of elastic metal members are respectively disposed in the plurality of through holes, wherein the top contact unit of each elastic metal member has a disc-shaped region surrounded by a slope with a low center point and a high outer edge, the disc-shaped region accommodating the protrusion and electrically connected during testing of the test base, wherein in the longitudinal section of the top contact unit, the slope is obtuse at the center point, and wherein the protrusion is substantially planar at the point of contact with the disc-shaped region and has a connecting end cross-sectional width, a contact end cross-sectional width and a protrusion height, the disc-shaped region having a recess height and a recess cross-sectional width, wherein the recess cross-sectional width is greater than the contact end cross-sectional width and the protrusion height is greater than the recess height.

15. The test socket as described in claim 14, wherein, The first conductive elastic sheet includes a plurality of conductive elastic regions corresponding to each of the plurality of elastic metal parts, and a plurality of conductive particles distributed within each of the conductive elastic regions.

16. The test socket as described in claim 14, wherein, The product of the recess height and the recess cross-sectional width, multiplied by the sum of the width of the connecting end cross-section and the width of the contact end cross-section, and then multiplied by the protrusion height, is less than 40%.

17. The test fixture as claimed in claim 14 further includes a second conductive elastic sheet disposed on the second surface, the second conductive elastic sheet having protrusions corresponding to each of the plurality of through holes, and the bottom contact units of each of the elastic metal members not exposed from the base.

18. The test socket as described in claim 17, wherein, The second conductive elastic sheet is locked or adhered to the second surface.

19. The test socket as described in claim 14, wherein, The first conductive elastic sheet is floated on the first surface.

20. The test socket as described in claim 14, wherein, The disc-shaped region appears as a continuous surface when viewed from above.

21. The test socket as described in claim 14, wherein, The test socket is adapted to be mounted on a circuit board, and each of the through holes is a straight through hole, so that when the test socket is fixed to the circuit board, each of the elastic metal parts in each of the through holes is in an unpressurized state.

22. The test socket as described in claim 14, wherein, The elastic metal component is a signal needle and includes at least one cylindrical portion, a spring located within the cylindrical portion, a bottom contact unit, and a top contact unit.

23. The test socket as described in claim 22, wherein, The end face of the cylinder defines the top contact unit.

24. The test socket as described in claim 22, wherein, The bottom contact unit and the top contact unit have essentially the same structure.

25. The test socket as described in claim 22, wherein, The outer diameter of the bottom contact unit is approximately equal to the outer diameter of the cylindrical section.

26. As per request item 22, the test socket, wherein, The base is made of metal and has an insulating layer located inside the through hole and surrounding the elastic metal part.

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