Integrated chip and method of manufacturing the same
TW202642920APending Publication Date: 2026-10-16TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information
- Application Number
- TW114139520
- Authority / Receiving Office
- TW · TW
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-08-21
- Filing Date
- 2025-10-14
- Publication Date
- 2026-10-16
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Abstract
An integrated chip includes a barrier layer including a first conductive material over a semiconductor substrate. The integrated chip includes a lower electrode layer including a second conductive material, different than the first conductive material, over the barrier layer. The integrated chip includes a dielectric layer over the lower electrode layer. The integrated chip includes an upper electrode layer over the dielectric layer. The integrated chip includes an encapsulation layer including a first dielectric material encapsulating the upper electrode layer, the dielectric layer, the lower electrode layer, and the barrier layer. The integrated chip includes a spacer layer including a second dielectric material, different than the first dielectric material, on an upper surface of the barrier layer. The encapsulation layer is spaced from sidewalls of the lower electrode layer, sidewalls of the dielectric layer, and sidewalls of the upper electrode layer by the spacer layer.
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