Semiconductor device and manufacturing method thereof

TW202642998APending Publication Date: 2026-10-16TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information

Application Number
TW114143366
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-09-08
Filing Date
2025-11-06
Publication Date
2026-10-16

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Abstract

A method includes forming a semiconductor device over a substrate, and forming an interconnect structure over the semiconductor device. The interconnect structure includes a metal plug including a first metal disposed in a first dielectric layer. A second dielectric layer is formed over the first dielectric layer. The second dielectric layer has an opening therein exposing the metal plug. A nitridation process is performed on the metal plug to form a nitridation layer on the metal plug.
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