Strain gauge
TWD246819SActive Publication Date: 2026-09-21LUCEO
Patent Information
- Application Number
- TW115300272
- Authority / Receiving Office
- TW · TW
- Patent Type
- Designs
- Current Assignee / Owner
- Priority Date
- 2025-08-22
- Filing Date
- 2026-01-21
- Publication Date
- 2026-09-21
- Estimated Expiration
- 2041-01-20
Smart Images

Figure TWG2TB001913006_001 
Figure TWG2TB001913006_002 
Figure TWG2TB001913006_003
Abstract
【Item Uses】 This design is a strain gauge that utilizes optical properties to measure the internal strain of a sample. The strain gauge comprises: a light source consisting of a light-emitting diode and a light guide plate; a diffuser plate to diffuse the light emitted from the light source; a polarizer (polarizing plate) to allow light passing through the diffuser plate; a wavelength plate to allow light passing through the diffuser plate, polarizer, sample, and wavelength plate to pass through; and an analyzer (rotating analyzer) that allows light passing through the diffuser plate, polarizer, sample, and wavelength plate to pass through and measures the internal strain of the sample based on the rotation angle. It can be used in an upright position or horizontally. Furthermore, the distance between the polarizer and the analyzer can be adjusted by rotating a knob to move the analyzer. In addition, by replacing the wavelength plate with components of different optical properties, different measurement methods such as the orthogonal Nicol method, sensitive colorimetry, and Seinemont method can be used to measure strain.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Check the bracket
CN309143290S
Device appearance inspection equipment
JP1784022S
Testing apparatus for semiconductor devices
TWD235295S
Casing for a non-destructive inspection instrument
USD769746S
